Wirebond pad for semiconductor chip or wafer

ABSTRACT

In the present invention, copper interconnection with metal caps is extended to the post-passivation interconnection process. Metal caps may be aluminum. A gold pad may be formed on the metal caps to allow wire bonding and testing applications. Various post-passivation passive components may be formed on the integrated circuit and connected via the metal caps.

This application is a continuation application of Ser. No. 10/796,427filed on Mar. 9, 2004, which claims priority to U.S. Provisional PatentApplication Ser. No. 60/489,564, filed on Jul. 23, 2003, both of whichare herein incorporated by reference in their entirety.

RELATED PATENT APPLICATIONS

This application is related to Ser. No. 10/154,662, filed on May 24,2002, and assigned to a common assignee.

This application is related to Ser. No. 10/445,558, filed on May 27,2003, and assigned to a common assignee.

This application is related to Ser. No. 10/445,559, filed on May 27,2003, and assigned to a common assignee.

This application is related to Ser. No. 10/445,560, filed on May 27,2003, and assigned to a common assignee.

BACKGROUND OF THE INVENTION

1. Field of the Invention

This invention relates to structures and methods of assembly ofintegrated circuit chips. More particularly, this invention relates topost-passivation technologies with metal caps.

2. Description of the Related Art

Copper interconnection requires an aluminum cap at the passivationopenings to protect the copper from environmental deterioration such asoxidation from the ambient and to provide a metal pad for wire bonding.Today many integrated circuit chips use copper as the interconnectionmetal. From a performance perspective, copper interconnection offers ahigher propagation speed than does an aluminum interconnection, makingcopper a desirable technological solution for current IC design.However, copper interconnection also incurs reliability concerns. When acopper I/O pad is exposed to atmosphere, its surface is subjected tochemical attack by the oxygen and moisture in the atmosphere. Toovercome this problem, prior art has disclosed a method and structure toprevent copper chemical attack. By depositing a metal (such as aluminum(Al)) cap layer on the surface of the copper I/O pad, the copper I/O padcan remain intact in the passivation opening in the ambient. This metalcap layer is especially important where processing through thepassivation layer is performed in one fab and then post-passivationprocessing is performed in another fab. Moreover, an Al (or other metal)pad is able to form a stable bonding structure with Au wire. Copperalone cannot form a bondable structure with Au wire. Therefore, the Alcap layer provides the wire-bonding capability for the copper I/O pad.FIG. 1 shows an aluminum cap 32 on a copper line 24. The Al cap allowsthe formation of a wire bond 40 attaching to it firmly. For example,U.S. Pat. No. 6,451,681 to Greer and U.S. Pat. No. 6,376,353 to Zhouteach using an Al cap over a copper bond pad for wire bonding. U.S. Pat.No. 6,544,880 to Akram discloses gold over a copper pad and optionallyadditional metals to prevent formation of intermetallic compounds inwire bonding.

U.S. Pat. Nos. 6,495,442 and 6,383,916 to M. S. Lin et al disclose apost-passivation interconnection process. The continued emphasis in thesemiconductor technology is to create improved performance semiconductordevices at competitive prices. This emphasis over the years has resultedin extreme miniaturization of semiconductor devices, made possible bycontinued advances of semiconductor processes and materials incombination with new and sophisticated device designs. Most of thesemiconductor devices that are at this time being created are aimed atprocessing digital data. There are however also numerous semiconductordesigns that are aimed at incorporating analog functions into devicesthat simultaneously process digital and analog data, or devices that canbe used for the processing of only analog data. One of the majorchallenges in the creation of analog processing circuitry (using digitalprocessing procedures and equipment) is that a number of the componentsthat are used for analog circuitry are large in size and are thereforenot readily integrated into devices that typically have feature sizesthat approach the sub-micron range. The main components that offer achallenge in this respect are capacitors and inductors, since both thesecomponents are, for typical analog processing circuits, of considerablesize.

One of the problems that is encountered when creating an inductor on thesurface of a semiconductor substrate is that the self-resonance that iscaused by the parasitic capacitance between the (spiral) inductor andthe underlying substrate will limit the use of the inductor at highfrequencies. As part of the design of such an inductor it is thereforeof importance to reduce the capacitive coupling between the createdinductor and the underlying substrate. Co-pending U.S. patentapplication Ser. Nos. 10/445,558, 10/445,559, and 10/445,560 apply thepost-passivation process of U.S. Pat. No. 6,383,916 in addition tocreating high quality electrical components, such as an inductor, acapacitor or a resistor, on a layer of passivation or on the surface ofa thick layer of dielectric.

SUMMARY OF THE INVENTION

An object of this invention is to provide post-passivationinterconnection wherein copper pads are capped with metal pads.

Another object of this invention is to provide post-passivation metalinterconnection for wire bonding or testing purposes wherein copper padsare capped with a different metal.

A further object is to provide post-passivation metal interconnectionfor wire bonding or testing purposes wherein copper pads are capped withanother metal and further covered with gold.

Another object is to deposit thin film passive components on top of aninductor using copper pads capped with aluminum as the connecting node.

Another object is to attach surface mounted passive components such ascapacitors, resistors, and inductors to wirebonds throughpost-passivation metal lines above the passivation layer.

In accordance with the objects of the invention, a high performanceintegrated circuit chip is disclosed.

Also in accordance with the objects of the invention, a method offabricating a high performance integrated circuit chip is achieved.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows a cross-sectional view of a wire bond of the prior art.

FIG. 2 shows a cross-sectional view of a wire bonding application of thepresent invention.

FIG. 3 shows a cross-sectional view of a testing application of thepresent invention.

FIGS. 4A and 4B show cross-sectional views of a preferred embodiment ofthe present invention having a single post-passivation interconnectlayer.

FIG. 5 shows a cross-sectional view of a preferred embodiment of thepresent invention having multiple post-passivation interconnect layers.

FIG. 6 shows a cross-sectional view of a preferred embodiment of thepresent invention including an inductor.

FIG. 7 shows a cross-sectional view of a preferred embodiment of thepresent invention including a resistor.

FIG. 8 shows a cross-sectional view of a preferred embodiment of thepresent invention including a capacitor formed by a first alternativeprocess.

FIG. 9 shows a cross-sectional view of a preferred embodiment of thepresent invention including a capacitor formed by a second alternativeprocess.

DETAILED DESCRIPTION OF THE INVENTION

The prior art did not extend the application of a metal cap layer toother useful applications such as post-passivation interconnection ortesting through the redistribution layer (RDL). The present inventiondiscloses a structure and method to extend the concept of a metal cap ona copper interconnection to a post-passivation interconnection scheme.In a post passivation processing sequence, as described in copendingU.S. patent application Ser. No. 10/154,662 filed on May 24, 2002 andherein incorporated by reference, a thick layer of dielectric isoptionally deposited over a layer of passivation and layers of wide andthick metal lines are formed on top of the thick layer of dielectric.

By adding a post-passivation interconnection scheme on a metal (such asAl) pad, where the post-passivation metal is, for example, gold orcopper, several advantages emerge. A post-passivation metal trace can beformed either as a stripe or a meander line. When the trace is formed asa stripe, the stripe offers itself as an alternative testing site or asa wire-bonding site for the metal cap. When the trace meanders throughseveral I/O pads, it serves virtually as an alternative interconnectionscheme for the IC chip. It is much coarser and hence, faster than is thefine line interconnection line located under the passivation layer.Post-passivation metal also allows one to place passive components suchas a capacitor, resistor, or inductor on an IC chip, as taught inco-pending U.S. patent application Ser. No. 10/445,558 to M. S. Lin etal, herein incorporated by reference.

In brief, post-passivation interconnection offers three essentialadvantages to IC chips: post-passivation interconnection

1) lowers parasitic resistance and capacitance to enhance the speed ofthe IC chip,

2) facilitates system-on-a-chip (SOC) and system-in-a-package (SIP)design with on-chip passive structures, and

3) allows Au interconnection offering wire bonding capability andtesting capability to the IC chip.

When a Au/Al dual cap layer is used as the wire bonding pad on thecopper I/O pad, the Au pad provides better performance than does the Alpad because the Au pad bears superior bondability and protection for theactive devices. A barrier layer of, for example, TiW is typically formedbetween the Al cap and the overlying Au.

A Au pad also offers protection for the active devices as described inco-pending U.S. patent application Ser. No. 10/434,142, filed on May 8,2003, and herein incorporated by reference. This is due mainly to theductility of gold. When conducting testing or during the wire-bondingprocess, the gold pad is able to absorb the mechanical energy caused byimpetus from a stylus. Thus, the active devices underneath can beprotected.

It will be understood by those skilled in the art that the presentinvention should not be limited to any of the examples shown, but can beextended and applied to any kind of IC chip design.

Referring now to FIGS. 2 and 3, there is shown an example of a preferredembodiment of the present invention. Semiconductor substrate 10 isshown. Transistors and other devices 11 are formed in and on thesemiconductor substrate 10. Multiple layers of conductive lines 16 anddielectric layers 14 are formed over the substrate. On the topmostintermetal dielectric layer 22, a copper contact pad 24 is formed.Passivation layer 30 is formed over the top metal layer 24. Thepassivation layer is used to protect the underlying devices, such astransistors, polysilicon resistors, poly-to-poly capacitors, andfine-line metal interconnections, not shown and the topmost interleveldielectric layer from penetration of mobile ions (such as sodium ions),moisture, transition metal (such as gold or silver), and othercontaminations. For example, the passivation layer may be a composite ofoxide and nitride where the nitride is greater than about 0.3 μm inthickness.

A metal cap layer 32 is formed overlying the copper contact pad 24. Anopening is made through the passivation layer to the copper contact pad24. A metal layer is deposited by physical vapor deposition or bychemical vapor deposition into the opening and over the passivationlayer. The metal layer is patterned to form the metal cap 32. The metalcap may be aluminum or an aluminum alloy.

Now, an adhesion/barrier layer 34 is deposited over the passivationlayer and metal cap as shown in FIGS. 2 and 3. This adhesion/barrierlayer is preferably titanium tungsten (TiW) if the post-passivation bulkmetal is Au. For Cu bulk post-passivation, the adhesion/barrier layer istypically Cr, Ti, or TiW. Other possible barrier materials includetitanium nitride, tantalum, and tantalum nitride. The adhesion/barrierlayer is preferably deposited to a thickness of between about 2700 and3300 Angstroms.

A gold (Au) or copper (Cu) seed layer 35 is now deposited over thebarrier layer 34 by sputtering or electroplating to cover the barrierlayer as shown in the figures. The seed layer has a thickness of betweenabout 900 and 1100 Angstroms. The substrate is coated with resist whichis exposed and developed by a photolithography process, leaving openingswhere the metal body is to be formed. Now, the Au or Cu metal body 36 iselectroplated on the seed layer 35 to a thickness of between about 2 μmand 20 μm. The resist is removed by an etching process. Thebarrier/adhesion layer is etched in a self-aligned etch. Thebarrier/adhesion layer covered by the Au or Cu metal body 36 remainswhile the barrier/adhesion layer elsewhere is etched away.

Now, Au wire 40 can be bonded to the Au pad 36 as shown in FIG. 2. Or,the copper contact pad 24 with Al cap 32 and Au pad 36 can be used fortesting applications, as shown in FIG. 3.

The post-passivation interconnect process has been described in U.S.Pat. No. 6,383,916. The following figures illustrate the application ofa metal cap with the post-passivation interconnect process.

Referring now to FIG. 4A, there is shown a cross section of oneimplementation of U.S. Pat. No. 6,383,916 and the present invention. Thesurface of silicon substrate 10 has been provided with transistors 11and other devices. The surface of substrate 10 is covered by interleveldielectric (ILD) layers and intermetal dielectric layers (IMD) 14 and 18formed over the devices.

Dielectric layers 14 and 18 contain one or more layers of dielectric,interspersed with one or more metal interconnect lines 16 that make up anetwork of electrical connections. At a topmost metal layer are pointsof electrical contact such as contact pads 24. A passivation layer 30,formed of, for example, a composite layer of silicon oxide and siliconnitride, is deposited over the surface of layer 18, and functions toprevent the penetration of mobile ions (such as sodium ions), moisture,transition metal (such as gold, silver), and other contamination. Thepassivation layer is used to protect the underlying devices (such astransistors, polysilicon resistors, poly-to-poly capacitors, etc.) andthe fine-line metal interconnection.

Now, a metal (such as Al or an aluminum alloy) layer is deposited intothe opening and over the passivation layer. The metal layer is patternedto form the metal cap 32.

A post-passivation interconnect dielectric layer 33 optionally isdeposited over the passivation layer 20 and the Al metal layer 24. Thisdielectric layer 33 is preferably polyimide, BCB, a low dielectricconstant (k) dielectric material, or an elastomer having a thickness ofbetween about 2 μm and 20 μm through photolithographic process steps.Now, openings are made through the dielectric layer 33 to the metal caps24.

Now, an adhesion/barrier layer 34 is deposited over the dielectric layer33 and metal cap 24. This adhesion/barrier layer is preferably titaniumtungsten (TiW). Other possible materials are TiN and TaN.

As described above, a gold (Au) or other metal is now electroplated toform metal pads 36 as shown in the FIG. 4A. For example, the 36 may be agold meander line, shown connecting the two pads which allows the chipto conduct wire-bonding or testing without damaging the active devices.As both the Au layer and the dielectric layer 33 are able to absorb themechanical shock caused by the poking process during testing orwire-bonding, damage to the active devices can be avoided.

FIG. 4B shows another use of the gold pad. The gold may be used for padrelocation. For example, as shown in FIG. 4B, the gold line 36 isconnected to the metal pad 24. The gold line 36 is extended away fromthe metal pad 24. A dielectric layer 42 is deposited overlying the goldline 36. An opening 200 may be made to the gold line 36. A wirebond canbe formed at the relocation point 31 (contact point). The region 31 ofthe extended gold pad could be used for a test probe.

FIG. 5 shows another embodiment of the present invention. In thisembodiment, after the metal line 36 is formed, a second post-passivationlayer 43 is deposited over the metal line 36. Openings are made throughthe second dielectric layer 43 to the metal line 36. Now, anadhesion/barrier layer 45 is deposited over the dielectric layer 43 andwithin the openings. A gold (Au) or other metal layer is now formed in asimilar manner to line 36 in FIG. 4 over the barrier layer 45 to formthe metal line 46 as shown in the FIG. 5.

The process of the present invention can be used in forming a variety ofdiscrete passive components in the post-passivation process. Forexample, FIG. 6 illustrates an inductor 38 formed from the metal layer36 and barrier layer 34. Shown are metal lines 36 and inductor 38.

FIG. 7 illustrates the formation of a resistor 44. Dielectric layer 33has been formed over the passivation layer 30 and Al or other metal caps32. Openings are made through the dielectric layer 33 to the pads 24having metal caps 32. A metal layer over the dielectric layer and withinthe openings forms the resistor 44. Optionally, a post-passivation layer45 may be formed over the resistor 44.

FIG. 8 illustrates the formation of a capacitor. Dielectric layer 33 hasbeen formed over the passivation layer 30 and Al or other metal caps 32.Openings are made through the dielectric layer 33 to the pads 24 havingmetal caps 32. Adhesion/barrier layer 34 is deposited over thepassivation layer and within the openings. A metal layer over thebarrier layer 34 forms the metal line 36 and the bottom electrode of thecapacitor 46. A capacitor dielectric layer 48 is deposited and etchedaway to leave the capacitor dielectric layer 48 on the top and sidewallsof the bottom electrode 46. A second conducting layer is used to formthe top capacitor electrode 50 to complete formation of the capacitor.

A dielectric layer 52 is deposited overlying the capacitor and the metalline 36. An opening 54 is made through the dielectric layer 52 to thetop electrode 50 for wire bonding or solder bonding.

In another alternative, commercially available discrete capacitors areused. These capacitors have already been coated with solder at both ends(terminals or electrodes). Therefore, on the IC wafer, dielectric layer33 is formed over the passivation layer 30 and Al or other metal caps32. Openings are made through the dielectric layer 33 to the pads 24having metal caps 32. A barrier or wetting layer 56 is deposited overthe passivation layer and patterned to leave the wetting layer withinand immediately surrounding the openings. Solder balls 58 are formedwithin and over the openings as shown in FIG. 9. The discrete capacitor60 is attached to the IC by the solder balls 58. A dielectric layer 62is deposited to cover the capacitor 60. Other discrete passivecomponents can be surface mounted over the passivation layer in asimilar manner.

While this invention has been particularly shown and described withreference to the preferred embodiments thereof, it will be understood bythose skilled in the art that various changes in form and details may bemade without departing from the spirit and scope of the invention.

1. A semiconductor chip comprising: a silicon substrate; a transistor inand on said silicon substrate; a first dielectric layer over saidsilicon substrate; an interconnecting metallization structure over saidfirst dielectric layer, wherein said interconnecting metallizationstructure comprises a first metal layer, a second metal layer over saidfirst metal layer, and a copper pad having a top surface and a sidewall,wherein said top surface has a first region and a second region betweensaid sidewall and said first region; a second dielectric layer betweensaid first and second metal layers; a passivation layer over saidinterconnecting metallization structure, on said second region and oversaid first and second dielectric layers, wherein an opening in saidpassivation layer is over said first region, and said first region is ata bottom of said opening in said passivation layer, and wherein saidpassivation layer comprises an insulating nitride; an aluminum capcomprising a first portion directly over said first region and a secondportion directly over said passivation layer, wherein said aluminum capis connected to said copper pad through said opening in said passivationlayer, and wherein said aluminum cap has a width greater than that ofsaid opening in said passivation layer; an adhesion/barrier layer onsaid aluminum cap; and a gold layer on said adhesion/barrier layer anddirectly over said first and second portions of said aluminum cap,wherein said gold layer comprises a gold seed layer and an electroplatedgold layer on said gold seed layer, wherein said electroplated goldlayer has a thickness between 2 and 20 micrometers and wherein saidelectroplated gold layer is connected to said copper pad through saidgold seed layer, said adhesion barrier/layer, and said aluminum cap. 2.The semiconductor chip of claim 1, wherein said adhesion/barrier layercomprises titanium.
 3. The semiconductor chip of claim 1, wherein saidadhesion/barrier layer comprises a titanium-tungsten alloy.
 4. Thesemiconductor chip of claim 1, wherein said adhesion/barrier layercomprises titanium nitride.
 5. The semiconductor chip of claim 1,wherein said adhesion/barrier layer comprises tantalum.
 6. Thesemiconductor chip of claim 1, wherein said gold layer is used to betested thereto.
 7. The semiconductor chip of claim 1, wherein saidpassivation layer further comprises an oxide.
 8. The semiconductor chipof claim 1, wherein said insulating nitride has a thickness greater than0.3 micrometers.
 9. A semiconductor chip comprising: a siliconsubstrate; a transistor in and on said silicon substrate; a firstdielectric layer over said silicon substrate; an interconnectingmetallization structure over said first dielectric layer, wherein saidinterconnecting metallization structure comprises a first metal layer, asecond metal layer over said first metal layer, and a copper pad havinga top surface and a sidewall, wherein said top surface has a firstregion and a second region between said sidewall and said first region;a second dielectric layer between said first and second metal layers; apassivation layer over said interconnecting metallization structure, onsaid second region and over said first and second dielectric layers,wherein an opening in said passivation layer is over said first region,and said first region is at a bottom of said opening in said passivationlayer, and wherein said passivation layer comprises an insulatingnitride; an adhesion/barrier layer over said first region and over saidpassivation layer; and a gold layer on said adhesion/barrier layer,wherein said gold layer comprises a gold seed layer and an electroplatedgold layer on said gold seed layer, wherein said electroplated goldlayer has a thickness between 2 and 20 micrometers, electroplatedwherein said gold layer is connected to said copper pad through saidgold seed layer and said adhesion barrier/layer and through said openingin said passivation layer, and wherein said gold layer comprises a firstportion directly over said first region and a second portion directlyover said passivation layer.
 10. The semiconductor chip of claim 9,wherein said adhesion/barrier layer comprises titanium.
 11. Thesemiconductor chip of claim 9, wherein said adhesion/barrier layercomprises a titanium-tungsten alloy.
 12. The semiconductor chip of claim9, wherein said adhesion/barrier layer comprises titanium nitride. 13.The semiconductor chip of claim 9, wherein said adhesion/barrier layercomprises tantalum.
 14. The semiconductor chip of claim 9, wherein saidgold layer is used to be tested thereto.
 15. The semiconductor chip ofclaim 9, wherein said passivation layer further comprises an oxide. 16.The semiconductor chip of claim 9, wherein said insulating nitride has athickness greater than 0.3 micrometers.
 17. The semiconductor chip ofclaim 9 further comprising a polymer layer on said passivation layer,wherein said adhesion/barrier layer is further on said polymer layer,and wherein said polymer layer has a thickness between 2 and 20micrometers.
 18. The semiconductor chip of claim 17, wherein saidpolymer layer comprises polyimide.
 19. The semiconductor chip of claim17, wherein said polymer layer comprises BCB.
 20. The semiconductor chipof claim 9 further comprising a third dielectric layer on said goldlayer, wherein an opening in said third dielectric layer is over saidgold layer, and said gold layer comprises a contact point at a bottom ofsaid opening in said third dielectric layer.
 21. The semiconductor chipof claim 9, wherein said transistor comprises a portion directly undersaid gold layer.
 22. The semiconductor chip of claim 1 furthercomprising a polymer layer on said passivation layer, wherein saidadhesion/barrier layer is further on said polymer layer, and whereinsaid polymer layer has a thickness between 2 and 20 micrometers.
 23. Thesemiconductor chip of claim 22, wherein said polymer layer comprisespolyimide.
 24. The semiconductor chip of claim 1 further comprising athird dielectric layer on said gold layer, wherein an opening in saidthird dielectric layer is over said gold layer, and said gold layercomprises a contact point at a bottom of said opening in said thirddielectric layer.
 25. The semiconductor chip of claim 1, wherein saidtransistor comprises a portion directly under said gold layer.